3D Precession Diffraction Tomography

DigiSTAR-precession electron diffraction (PED) device enables the collection of quasi-kinematical intensities (X-Ray like) in any TEM. PED in combination with powerful software (3D dif f fraction tomography) enables the reconstruction of the reciprocal cell of any nanomaterial and the automatic measurement of the reflection intensities.

Feature of 3D Precession Diffraction Tomography

Works with any TEM with 120-200-300 kV LaB6/W or FEG filament
Selected area (SAED) or Nanobeam (NBD) mode Smallest crystals used:~100nm organics & ~20nm inorganics.
Application for agglomerated / embedded samples Polyphasic materials
Diffraction data collection with any CCD camera (35mm port or on axis)1k x 1k or higher

Diffraction data collection with single tilt holder /tomography holder or cryoholder(for beam sensitive samples)
Minimum tilt (for cell parameters determination) -15°/+ 15° 1°step. Recommended tilt (for crystal structure determination)-45°/+45° 1° step.
DigiSTAR compatible with any TEM
Manual / automatic PED data collection (TEM config. dependent)