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Contact Monitor II

Μ Contact Monitor II

Controls the pressure applied on the ATR crystal during sample analysis. For ATR measurements the pressure is a very significant issue. Too much pressure can crack the ATR crystal and too much low pressure will make no good contact between ATR crystal and your sample. So to avoid that you can set an alarm at a specified pressure with μ Contact Monitor II. The alarm will be triggered as soon as you reach your pre-specified pressure limit.Like this you can apply the desired maximum pressure on the sample for obtaining a high quality spectrum without breaking your ATR-crystal.

Features & Specification

  • Controlled pressure exertion on sample and ATR-objective
  • Acoustic signal prevents applying excessive pressure
  • ATR objective and sample are protected efficiently against breaking
  • Error measurements resulting from high pressures are eliminated
  • Multiple samples can be measured at a specified pressure setting, thus speeding up theprocessing of samples
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