3D Precession Diffraction Tomography
DigiSTAR-precession electron diffraction (PED) device enables the collection of quasi-kinematical intensities (X-Ray like) in any TEM. PED in combination with powerful software (3D dif f fraction tomography) enables the reconstruction of the reciprocal cell of any nanomaterial and the automatic measurement of the reflection intensities.
Feature of 3D Precession Diffraction Tomography
- Works with any TEM with 120-200-300 kV LaB6/W or FEG filament
- Selected area (SAED) or Nanobeam (NBD) mode Smallest crystals used:~100nm organics & ~20nm inorganics.
- Application for agglomerated / embedded samples Polyphasic materials
- Diffraction data collection with any CCD camera (35mm port or on axis)1k x 1k or higher
- Diffraction data collection with single tilt holder /tomography holder or cryoholder(for beam sensitive samples)
- Minimum tilt (for cell parameters determination) -15°/+ 15° 1°step. Recommended tilt (for crystal structure determination)-45°/+45° 1° step.
- DigiSTAR compatible with any TEM
- Manual / automatic PED data collection (TEM config. dependent)
APPLICATION NOTE
Design Materials with Specific Applications
Challeging Materials with Challenging Applications
Better Steel with Improved Properties
Steel Corrosion in Nuclear Plants
Metals Under Huge Stress
Pavements of the Nanoworld
Structure of Embedded Nanodomains
Nanoscale Reaction Models in Solid Oxide Fuel Cells
Inside the Structure of Dye-Sensitized Solar Cells
Understanding Li insertion for next generation batteries
From “Clean Energy” Cars to Structure of Metal Organics MOFs
Next generation circuits for semiconductor industry
Structure of magnetic semiconductors
Atomic scale of nanolayer composites
