Electric Magnetic Field Mapping
4D-Scanning Precession Electron Diffraction (4D-SPED) in TEM is an advanced technique for high-resolution materials characterization, enabling precise orientation, phase, and strain mapping. By scanning the electron beam and capturing diffraction patterns at each point, it reveals local electric and magnetic fields. Enhanced by controlled beam precession, it delivers accurate, low-noise data for analyzing modern materials and nanoscale devices.
APPLICATION NOTE
Design Materials with Specific Applications
Challeging Materials with Challenging Applications
Better Steel with Improved Properties
Steel Corrosion in Nuclear Plants
Metals Under Huge Stress
Pavements of the Nanoworld
Structure of Embedded Nanodomains
Nanoscale Reaction Models in Solid Oxide Fuel Cells
Inside the Structure of Dye-Sensitized Solar Cells
Understanding Li insertion for next generation batteries
From “Clean Energy” Cars to Structure of Metal Organics MOFs
Next generation circuits for semiconductor industry
Structure of magnetic semiconductors
Atomic scale of nanolayer composites
Architecture of hybrid nanocrystalline microporous materials
Structure of new Sarrabusite mineral
Structure of intriguing meso-micrporous zeolites
Drug delivery & Structure of Nanoparticles
Inside the nanowire forest
